dm: Provide a function to scan child FDT nodes
At present only root nodes in the device tree are scanned for devices.
But some devices can have children. For example a SPI bus may have
several children for each of its chip selects.
Add a function which scans subnodes and binds devices for each one. This
can be used for the root node scan also, so change it.
A device can call this function in its bind() or probe() methods to bind
its children.
Signed-off-by: Simon Glass <sjg@chromium.org>
diff --git a/doc/driver-model/README.txt b/doc/driver-model/README.txt
index 672497d..a2b6122 100644
--- a/doc/driver-model/README.txt
+++ b/doc/driver-model/README.txt
@@ -95,9 +95,13 @@
You should see something like this:
<...U-Boot banner...>
- Running 17 driver model tests
+ Running 18 driver model tests
Test: dm_test_autobind
Test: dm_test_autoprobe
+ Test: dm_test_bus_children
+ Device 'd-test': seq 3 is in use by 'b-test'
+ Device 'c-test@0': seq 0 is in use by 'a-test'
+ Device 'c-test@1': seq 1 is in use by 'd-test'
Test: dm_test_children
Test: dm_test_fdt
Device 'd-test': seq 3 is in use by 'b-test'