commit | da305b9f57cd459a26d276390f699666a5d8bc4f | [log] [tgz] |
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author | York Sun <yorksun@freescale.com> | Fri Nov 06 09:58:46 2015 -0800 |
committer | York Sun <yorksun@freescale.com> | Mon Nov 30 09:11:12 2015 -0800 |
tree | 3d5977eb2fbf3d41d4e05cdc57b276f0b07de693 | |
parent | d764129d30768df72cd07844dd50d11e74b0de14 [diff] |
drivers/ddr/fsl: Fix typo in BIST test for DDR4 BIST test code has a typo, resulting the binding registers not maintained as expected. This typo results BIST runs twice on the covered memory. Signed-off-by: York Sun <yorksun@freescale.com> Reported-by: Shengzhou Liu <Shengzhou.Liu@freescale.com>