sandbox: add ADC unit tests
This commit adds unit tests for ADC uclass's methods using sandbox ADC.
Testing proper ADC binding:
- dm_test_adc_bind() - device binding
- dm_test_adc_wrong_channel_selection() - checking wrong channel selection
Testing ADC supply operations:
- dm_test_adc_supply():
- Vdd/Vss values validating
- Vdd regulator updated value validating
- Vdd regulator's auto enable state validating
Testing ADC operations results:
- dm_test_adc_single_channel_conversion() - single channel start/data
- dm_test_adc_single_channel_shot() - single channel shot
- dm_test_adc_multi_channel_conversion() - multi channel start/data
- dm_test_adc_multi_channel_shot() - multi channel single shot
Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com>
Cc: Simon Glass <sjg@chromium.org>
Signed-off-by: Minkyu Kang <mk7.kang@samsung.com>
diff --git a/test/dm/Makefile b/test/dm/Makefile
index 7b3626c..39630f6 100644
--- a/test/dm/Makefile
+++ b/test/dm/Makefile
@@ -33,4 +33,5 @@
obj-$(CONFIG_DM_USB) += usb.o
obj-$(CONFIG_DM_PMIC) += pmic.o
obj-$(CONFIG_DM_REGULATOR) += regulator.o
+obj-$(CONFIG_ADC) += adc.o
endif