dm: Rename DM test flags to make them more generic
The test flags used by driver model are currently not available to other
tests. Rather than creating two sets of flags, make these flags generic
by changing the DM_ prefix to UT_ and moving them to the test.h header.
This will allow adding other test flags without confusion.
Signed-off-by: Simon Glass <sjg@chromium.org>
diff --git a/test/dm/usb.c b/test/dm/usb.c
index 6cbb66c..db4b8ba 100644
--- a/test/dm/usb.c
+++ b/test/dm/usb.c
@@ -34,7 +34,7 @@
return 0;
}
-DM_TEST(dm_test_usb_base, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
+DM_TEST(dm_test_usb_base, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
/*
* Test that we can use the flash stick. This is more of a functional test. It
@@ -61,7 +61,7 @@
return 0;
}
-DM_TEST(dm_test_usb_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
+DM_TEST(dm_test_usb_flash, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
/* test that we can handle multiple storage devices */
static int dm_test_usb_multi(struct unit_test_state *uts)
@@ -77,7 +77,7 @@
return 0;
}
-DM_TEST(dm_test_usb_multi, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
+DM_TEST(dm_test_usb_multi, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
/* test that we have an associated ofnode with the usb device */
static int dm_test_usb_fdt_node(struct unit_test_state *uts)
@@ -99,7 +99,7 @@
return 0;
}
-DM_TEST(dm_test_usb_fdt_node, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
+DM_TEST(dm_test_usb_fdt_node, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
static int count_usb_devices(void)
{
@@ -143,7 +143,7 @@
return 0;
}
-DM_TEST(dm_test_usb_stop, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
+DM_TEST(dm_test_usb_stop, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
/**
* dm_test_usb_keyb() - test USB keyboard driver
@@ -435,4 +435,4 @@
return 0;
}
-DM_TEST(dm_test_usb_keyb, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
+DM_TEST(dm_test_usb_keyb, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);