1. c726fc0 dm: treewide: Use uclass_first_device_err when accessing one device by Michal Suchanek · 2 years, 2 months ago
  2. 2aefa6e i2c: add dm_i2c_reg_clrset by Sebastian Reichel · 3 years, 5 months ago
  3. a20b4a8 dm: test: Drop assumptions of no sequence numbers by Simon Glass · 4 years ago
  4. e180c2b dm: Rename DM test flags to make them more generic by Simon Glass · 4 years, 4 months ago
  5. 0e1fad4 dm: core: Drop header files from dm/test.h by Simon Glass · 4 years, 4 months ago
  6. f91f366 test: Use ut_asserteq_mem() where possible by Simon Glass · 4 years, 7 months ago
  7. 951674a dm: i2c: EEPROM simulator add tests for addr offset mask by Robert Beckett · 5 years ago
  8. 22e9351 dm: i2c: EEPROM simulator allow tests visibility of addr and offset by Robert Beckett · 5 years ago
  9. 031a650 dm: sandbox: i2c: Use new emulator parent uclass by Simon Glass · 6 years ago
  10. 83d290c SPDX: Convert all of our single license tags to Linux Kernel style by Tom Rini · 7 years ago
  11. 9119548 dm: Use dm_scan_fdt_dev() directly where possible by Simon Glass · 8 years ago
  12. e721b88 test: Generalize the unit test framework by Joe Hershberger · 10 years ago
  13. 182bf92 dm: i2c: Add an explicit test mode to the sandbox I2C driver by Simon Glass · 10 years ago
  14. ca88b9b dm: i2c: Add a dm_ prefix to driver model bus speed functions by Simon Glass · 10 years ago
  15. 25ab4b0 dm: i2c: Provide an offset length parameter where needed by Simon Glass · 10 years ago
  16. f9a4c2d dm: i2c: Rename driver model I2C functions to permit compatibility by Simon Glass · 10 years ago
  17. ecc2ed5 dm: i2c: Add tests for I2C by Simon Glass · 10 years ago