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a375ff8e14bea0a5cbfff99d6456aa8d9a3320ab
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test
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dm
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test-fdt.c
e160f7d
dm: core: Replace of_offset with accessor
by Simon Glass
· 8 years ago
e721b88
test: Generalize the unit test framework
by Joe Hershberger
· 9 years ago
83c7e43
dm: core: Allow uclass to set up a device's child before it is probed
by Simon Glass
· 10 years ago
9cc36a2
dm: core: Add a flag to control sequence numbering
by Simon Glass
· 10 years ago
f8a8544
dm: core: Allocate platform data when binding a device
by Simon Glass
· 10 years ago
1ca7e20
dm: Provide a function to scan child FDT nodes
by Simon Glass
· 10 years ago
f4cdead
dm: Allow a device to be found by its FDT offset
by Simon Glass
· 10 years ago
5a66a8f
dm: Introduce device sequence numbering
by Simon Glass
· 10 years ago
00606d7
dm: Allow drivers to be marked 'before relocation'
by Simon Glass
· 10 years ago
eb9ef5f
dm: Use an explicit expect value in core tests
by Simon Glass
· 10 years ago
ae7f451
dm: Rename struct device_id to udevice_id
by Simon Glass
· 10 years ago
54c5d08
dm: rename device struct to udevice
by Heiko Schocher
· 10 years ago
2e7d35d
dm: Add basic tests
by Simon Glass
· 11 years ago