1. 40441e0 test: dm: Move the dm tests over to the ut command by Joe Hershberger · 10 years ago
  2. e721b88 test: Generalize the unit test framework by Joe Hershberger · 10 years ago
  3. 754e71e dm: test: Add tests for device's uclass platform data by Przemyslaw Marczak · 10 years ago
  4. 57f54d5 dm: test: Allow 'dm test' to select a particular test to run by Simon Glass · 10 years ago
  5. 02c07b3 dm: core: Add a uclass pre_probe() method for devices by Simon Glass · 10 years ago
  6. 83c7e43 dm: core: Allow uclass to set up a device's child before it is probed by Simon Glass · 10 years ago
  7. 756ac0b test: dm: Support memory leak checking as a core feature by Simon Glass · 10 years ago
  8. a327dee dm: Add child_pre_probe() and child_post_remove() methods by Simon Glass · 10 years ago
  9. e59f458 dm: Introduce per-child data for devices by Simon Glass · 10 years ago
  10. 1ca7e20 dm: Provide a function to scan child FDT nodes by Simon Glass · 10 years ago
  11. 54c5d08 dm: rename device struct to udevice by Heiko Schocher · 11 years ago
  12. 2e7d35d dm: Add basic tests by Simon Glass · 11 years ago