blob: c0912a3437bb00e4f40a040073161f1df58ba125 [file] [log] [blame]
// SPDX-License-Identifier: GPL-2.0+
/*
* Unit tests for event handling
*
* Copyright 2021 Google LLC
* Written by Simon Glass <sjg@chromium.org>
*/
#include <common.h>
#include <dm.h>
#include <event.h>
#include <test/common.h>
#include <test/test.h>
#include <test/ut.h>
struct test_state {
struct udevice *dev;
int val;
};
static bool called;
static int h_adder(void *ctx, struct event *event)
{
struct event_data_test *data = &event->data.test;
struct test_state *test_state = ctx;
test_state->val += data->signal;
return 0;
}
static int h_adder_simple(void)
{
called = true;
return 0;
}
EVENT_SPY_SIMPLE(EVT_TEST, h_adder_simple);
static int test_event_base(struct unit_test_state *uts)
{
struct test_state state;
int signal;
state.val = 12;
ut_assertok(event_register("wibble", EVT_TEST, h_adder, &state));
signal = 17;
/* Check that the handler is called */
ut_assertok(event_notify(EVT_TEST, &signal, sizeof(signal)));
ut_asserteq(12 + 17, state.val);
return 0;
}
COMMON_TEST(test_event_base, 0);
static int test_event_simple(struct unit_test_state *uts)
{
called = false;
/* Check that the handler is called */
ut_assertok(event_notify_null(EVT_TEST));
ut_assert(called);
return 0;
}
COMMON_TEST(test_event_simple, 0);
static int h_probe(void *ctx, struct event *event)
{
struct test_state *test_state = ctx;
test_state->dev = event->data.dm.dev;
switch (event->type) {
case EVT_DM_PRE_PROBE:
test_state->val |= 1;
break;
case EVT_DM_POST_PROBE:
test_state->val |= 2;
break;
default:
break;
}
return 0;
}
static int test_event_probe(struct unit_test_state *uts)
{
struct test_state state;
struct udevice *dev;
state.val = 0;
ut_assertok(event_register("pre", EVT_DM_PRE_PROBE, h_probe, &state));
ut_assertok(event_register("post", EVT_DM_POST_PROBE, h_probe, &state));
/* Probe a device */
ut_assertok(uclass_first_device_err(UCLASS_TEST_FDT, &dev));
/* Check that the handler is called */
ut_asserteq(3, state.val);
return 0;
}
COMMON_TEST(test_event_probe, UT_TESTF_DM | UT_TESTF_SCAN_FDT);