| /* |
| * Test-related constants for sandbox |
| * |
| * Copyright (c) 2014 Google, Inc |
| * |
| * SPDX-License-Identifier: GPL-2.0+ |
| */ |
| |
| #ifndef __ASM_TEST_H |
| #define __ASM_TEST_H |
| |
| /* The sandbox driver always permits an I2C device with this address */ |
| #define SANDBOX_I2C_TEST_ADDR 0x59 |
| |
| #define SANDBOX_PCI_VENDOR_ID 0x1234 |
| #define SANDBOX_PCI_DEVICE_ID 0x5678 |
| #define SANDBOX_PCI_CLASS_CODE PCI_CLASS_CODE_COMM |
| #define SANDBOX_PCI_CLASS_SUB_CODE PCI_CLASS_SUB_CODE_COMM_SERIAL |
| |
| /** |
| * sandbox_i2c_set_test_mode() - set test mode for running unit tests |
| * |
| * See sandbox_i2c_xfer() for the behaviour changes. |
| * |
| * @bus: sandbox I2C bus to adjust |
| * @test_mode: true to select test mode, false to run normally |
| */ |
| void sandbox_i2c_set_test_mode(struct udevice *bus, bool test_mode); |
| |
| enum sandbox_i2c_eeprom_test_mode { |
| SIE_TEST_MODE_NONE, |
| /* Permits read/write of only one byte per I2C transaction */ |
| SIE_TEST_MODE_SINGLE_BYTE, |
| }; |
| |
| void sandbox_i2c_eeprom_set_test_mode(struct udevice *dev, |
| enum sandbox_i2c_eeprom_test_mode mode); |
| |
| void sandbox_i2c_eeprom_set_offset_len(struct udevice *dev, int offset_len); |
| |
| /* |
| * sandbox_timer_add_offset() |
| * |
| * Allow tests to add to the time reported through lib/time.c functions |
| * offset: number of milliseconds to advance the system time |
| */ |
| void sandbox_timer_add_offset(unsigned long offset); |
| |
| #endif |