blob: 06e73012680e869fdca2f90c1682a4145d784518 [file] [log] [blame]
Simon Glass6ec1b752014-12-10 08:55:51 -07001/*
2 * Test-related constants for sandbox
3 *
4 * Copyright (c) 2014 Google, Inc
5 *
6 * SPDX-License-Identifier: GPL-2.0+
7 */
8
9#ifndef __ASM_TEST_H
10#define __ASM_TEST_H
11
12/* The sandbox driver always permits an I2C device with this address */
Simon Glass9569c402015-03-05 12:25:26 -070013#define SANDBOX_I2C_TEST_ADDR 0x59
14
15#define SANDBOX_PCI_VENDOR_ID 0x1234
16#define SANDBOX_PCI_DEVICE_ID 0x5678
17#define SANDBOX_PCI_CLASS_CODE PCI_CLASS_CODE_COMM
18#define SANDBOX_PCI_CLASS_SUB_CODE PCI_CLASS_SUB_CODE_COMM_SERIAL
Simon Glass6ec1b752014-12-10 08:55:51 -070019
Simon Glass182bf922015-04-20 12:37:15 -060020/**
21 * sandbox_i2c_set_test_mode() - set test mode for running unit tests
22 *
23 * See sandbox_i2c_xfer() for the behaviour changes.
24 *
25 * @bus: sandbox I2C bus to adjust
26 * @test_mode: true to select test mode, false to run normally
27 */
28void sandbox_i2c_set_test_mode(struct udevice *bus, bool test_mode);
29
Simon Glass6ec1b752014-12-10 08:55:51 -070030enum sandbox_i2c_eeprom_test_mode {
31 SIE_TEST_MODE_NONE,
32 /* Permits read/write of only one byte per I2C transaction */
33 SIE_TEST_MODE_SINGLE_BYTE,
34};
35
36void sandbox_i2c_eeprom_set_test_mode(struct udevice *dev,
37 enum sandbox_i2c_eeprom_test_mode mode);
38
39void sandbox_i2c_eeprom_set_offset_len(struct udevice *dev, int offset_len);
40
Joe Hershberger909bd6d2015-04-21 13:57:18 -050041/*
42 * sandbox_timer_add_offset()
43 *
44 * Allow tests to add to the time reported through lib/time.c functions
45 * offset: number of milliseconds to advance the system time
46 */
47void sandbox_timer_add_offset(unsigned long offset);
48
Simon Glass6ec1b752014-12-10 08:55:51 -070049#endif