blob: b0844629f9ecd0cef0e0540ea4319bc91af75fba [file] [log] [blame]
Simon Glass0ae0cb72014-10-13 23:42:11 -06001/*
2 * Copyright (C) 2013 Google, Inc
3 *
4 * SPDX-License-Identifier: GPL-2.0+
5 */
6
7#include <common.h>
8#include <dm.h>
9#include <fdtdec.h>
10#include <spi.h>
11#include <spi_flash.h>
12#include <asm/state.h>
Simon Glass0ae0cb72014-10-13 23:42:11 -060013#include <dm/test.h>
14#include <dm/util.h>
Joe Hershbergere721b882015-05-20 14:27:27 -050015#include <test/ut.h>
Simon Glass0ae0cb72014-10-13 23:42:11 -060016
17/* Test that sandbox SPI flash works correctly */
Joe Hershbergere721b882015-05-20 14:27:27 -050018static int dm_test_spi_flash(struct unit_test_state *uts)
Simon Glass0ae0cb72014-10-13 23:42:11 -060019{
20 /*
21 * Create an empty test file and run the SPI flash tests. This is a
22 * long way from being a unit test, but it does test SPI device and
23 * emulator binding, probing, the SPI flash emulator including
24 * device tree decoding, plus the file-based backing store of SPI.
25 *
26 * More targeted tests could be created to perform the above steps
27 * one at a time. This might not increase test coverage much, but
28 * it would make bugs easier to find. It's not clear whether the
29 * benefit is worth the extra complexity.
30 */
31 ut_asserteq(0, run_command_list(
Simon Glassb5493d12014-12-02 13:17:31 -070032 "sb save hostfs - 0 spi.bin 200000;"
Simon Glass0ae0cb72014-10-13 23:42:11 -060033 "sf probe;"
34 "sf test 0 10000", -1, 0));
35 /*
36 * Since we are about to destroy all devices, we must tell sandbox
37 * to forget the emulation device
38 */
39 sandbox_sf_unbind_emul(state_get_current(), 0, 0);
40
41 return 0;
42}
43DM_TEST(dm_test_spi_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);